The JAI WAL-2001-GE is a high-resolution GigE 2K SWIR line scan camera with an InGaAs sensor designed for demanding industrial inspection applications requiring exceptional sensitivity and fine defect detection. Its innovative dual-line pixel-shift architecture produces 2K output while maintaining compatibility with standard C-mount optics. Combined with GigE Vision connectivity, large 12.5µm pixels, line rates up to 40 kHz, and high-sensitivity InGaAs imaging, the WAL-2001-GE is ideal for semiconductor inspection, food processing, recycling, electronics manufacturing, and material sorting.

JAI Wave SWIR line scan cameras are designed for high-speed SWIR imaging applications, and are available with GigE or Camera Link interfaces, multispectral or monochrome configurations.